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Entry-level Table-top SEM with 15 nm resolution & 60,000x magnification

Themost appropriate Table-Top SEM for the surface inspection with 60,000x of magnification which is universal inspection range by mini SEM.Two types of detectors are adopted for measuring SE images(surface information images) and BSE images(information of materials : brightness and darkness dependent on the components of materials).

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Model 3200M provides convenient stagemovement, SE/BSE images and fully programmed mouse control. Especially wedesigned for providing the chic software including visual part ofcomuter application and operating system through which our clients interact with computer and software. (SE/BSE images with dual view mode to see the images together at the same time)

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SE (Secondary Electron)

Providing images with the height level information, Mostly used for surface inspection

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BSE (Back Scattered Electron)

Information of materials : brightness and darkness dependent on the components and atomic number of materials)

Chic software/Easy operation

User interface isdesigned for convenience with mouse/ Dual view mode (SE/BSE images)

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