Same resolution with normal sem with 5 nm resolution & 150,000x magnification
The most appropriate Table-Top SEM for the surface inspection with 150,000x of magnification which is universal inspection range by mini SEM.(miniaturizing modules) Multi detector is adopted for measuring SE images. (surface information images)and information of materials : brightness and darkness dependent on the components of materials)
Model 4500M Plus provides convenient stage movement, SE images and fully programmed mouse control. Especially we designed for providing the chic software including visual part of comuter application and operating system through which our clients interact with computer and software. And this system can locate the target place easily through navigation tool installed inside the equipment.
SE (Secondary Electron)
Providing images with the height level information, Mostly used for surface inspection
BSE (Back Scattered Electron)
Information of materials : brightness and darkness dependent on the components and atomic number of materials).
Chic software/Easy operation
User interface isdesigned for convenience with mouse/ Dual view mode (SE/BSE images)
